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Materials Science

NSC01

Nikon Optiphot 200 8" x 8" Semiconductor Inspection Microscope

The embodiment of recent thinking in ergonomic 200 mm. semiconductor inspection microscopes, the Nikon Optiphot 200 offers numerous features that markedly enhance efficiency and comfort.

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Photos

NSC01 — Nikon Optiphot 200 8" x 8" Semiconductor Inspection Microscope; Catalog thumbnail
Catalog thumbnail
NSC01 — Nikon Optiphot 200 8" x 8" Semiconductor Inspection Microscope; Catalog thumbnail

Specifications

Instrument notes

  1. Full Nomarski DIC capability at 200x and 500x for simplified defect management and quality control in the sub-micron range. Other magnifications optionally available.
  2. Extra-Long Working Distance (ELWD) objective specification guarantees the safety of the critical lens front elements and the valuable samples under review.
  3. The motorized polarizer and revolving objective nosepiece are controlled from a remote keypad, amply demonstrating Nikon's attention to concerns over wafer contamination.
  4. Forward-positioned stage and focus controls complement this thinking.
  5. User ergonomics further addressed with widefield tilting trinocular eyepiece tube.
  6. Bright 12 v, 100 w halogen illuminator assures short time exposures and crisp video.