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Materials & inspection
Metallurgical and inspection microscopes for reflected-light work.
Reflected light, darkfield, and Nomarski DIC systems configured for metallography, semiconductor inspection, and failure analysis.
Common applications
What customers configure in this discipline.
Not sure which platform fits? Describe your work and we’ll help choose the right optical path.
- Metallography and grain-structure analysis
- Semiconductor and wafer inspection
- Failure analysis and quality control
- Reflected-light darkfield and DIC
From current inventory
22 Materials Science instruments in the catalog.
A sample of what’s available now. Browse the full catalog or ask about something specific.
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Olympus BHSM Metallurgical Microscope for Incident & Transmitted Light
- Brand
- Olympus
- Type
- Upright Metallurgical Microscopes
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Spectra-Tech IR-Plan Microscope for Transmitted and Reflected Light Microspectrometry and FTIR Sampling
- Brand
- Spectra-Tech
- Type
- Infrared Microscopes
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Leitz Forensic Bullet Comparison Macroscope
- Brand
- Leitz
- Type
- Specialty Metallurgical Microscopes
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Leitz Laborlux 12 HL for Reflected Light Nomarski DIC
- Brand
- Leitz
- Type
- Upright Metallurgical Microscopes
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Leica DMLM for Incident Light Brightfield, Darkfield & Nomarski DIC
- Brand
- Leica
- Type
- Upright Metallurgical Microscopes